Determination of azimuth angle, incidence angle, and contact-potential difference for low-energy electron-diffraction fine-structure measurements
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Physical Review B
سال: 1988
ISSN: 0163-1829
DOI: 10.1103/physrevb.38.8668